湿热环境下电子引信缺陷演化对引信贮存寿命的影响分析

张成, 张骢, 喻俊淼, 史瑞, 李海铭

装备环境工程 ›› 2025, Vol. 22 ›› Issue (10) : 11-17.

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装备环境工程 ›› 2025, Vol. 22 ›› Issue (10) : 11-17. DOI: 10.7643/ issn.1672-9242.2025.10.002
武器装备

湿热环境下电子引信缺陷演化对引信贮存寿命的影响分析

  • 张成1, 张骢1, *, 喻俊淼2, 史瑞1, 李海铭1
作者信息 +

Analysis of the Impact of Defect Evolution on the Storage Life of Electronic Fuzes under Hot-Humid Environments

  • ZHANG Cheng1, ZHANG Cong1, *, YU Junmiao2, SHI Rui1, LI Haiming1
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文章历史 +

摘要

目的 明确湿热环境下电子引信的主要缺陷类型与寿命演化特征,研究环境应力对引信贮存寿命的影响规律,构建适用于湿热应力的寿命预测模型。方法 分析电子引信在湿热贮存条件下的典型失效模式,识别关键缺陷与失效路径。在此基础上,引入Hallberg-Peck加速模型与Weibull分布函数,建立以缺陷演化为核心的寿命建模方法,并通过构造样本数据进行模型验证与寿命预测。结果 模拟样本验证结果表明,该模型能够较好地反映湿热环境下引信寿命的衰退趋势,所得加速因子与实际应力水平变化具有一致性,拟合分布具有良好的解释性与可适应性。结论 基于缺陷主导机制构建的寿命模型可有效评估湿热应力对引信寿命的影响,具备较高的工程适用性,为后续引信缺陷检测与寿命预测一体化提供了方法支撑与理论依据。

Abstract

The work aims to identify the main defect types and life evolution characteristics of electronic fuzes under hot and humid conditions, investigate the impact of environmental stress on fuze storage life, and develop a life prediction model suitable for hot and humid stress fields. The typical failure modes of electronic fuzes under hot and humid storage conditions were analyzed to identify key defects and failure paths. Based on this, the Hallberg-Peck acceleration model and the Weibull distribution function were introduced to establish a life modeling method focused on defect evolution, with model verification and lifespan prediction performed with constructed sample data. Simulation results showed that the model could effectively reflect the degradation trend of fuze life in a hot and humid environment, with the acceleration factor being consistent with actual stress level variations. The fitted distribution demonstrates good interpretability and adaptability. The life model based on defect-dominated mechanisms can effectively assess the impact of hot and humid stress on fuze life, offering high engineering applicability and providing a methodological and theoretical foundation for the integration of defect detection and life prediction in future work.

关键词

电子引信 / 湿热环境 / 缺陷演化 / 加速寿命 / Weibull分布 / 寿命建模 / 蒙特卡洛模拟

Key words

electronic fuze / hot-humid environment / defect evolution / accelerated life / Weibull distribution / life modeling / Monte Carlo simulation

引用本文

导出引用
张成, 张骢, 喻俊淼, 史瑞, 李海铭. 湿热环境下电子引信缺陷演化对引信贮存寿命的影响分析[J]. 装备环境工程. 2025, 22(10): 11-17 https://doi.org/10.7643/ issn.1672-9242.2025.10.002
ZHANG Cheng, ZHANG Cong, YU Junmiao, SHI Rui, LI Haiming. Analysis of the Impact of Defect Evolution on the Storage Life of Electronic Fuzes under Hot-Humid Environments[J]. Equipment Environmental Engineering. 2025, 22(10): 11-17 https://doi.org/10.7643/ issn.1672-9242.2025.10.002
中图分类号: TJ430   

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