PDF(1443 KB)
PDF(1443 KB)
PDF(1443 KB)
湿热环境下电子引信缺陷演化对引信贮存寿命的影响分析
Analysis of the Impact of Defect Evolution on the Storage Life of Electronic Fuzes under Hot-Humid Environments
电子引信 / 湿热环境 / 缺陷演化 / 加速寿命 / Weibull分布 / 寿命建模 / 蒙特卡洛模拟
electronic fuze / hot-humid environment / defect evolution / accelerated life / Weibull distribution / life modeling / Monte Carlo simulation
/
| 〈 |
|
〉 |